![](/views/old_jom/img/center_up.gif)
Search
![](/views/old_jom/img/dot2.gif)
Efficient Approach to Measure Crystallization Temperature in Amorphous Thin Film by Infrared Reflectivity
Journal of Magnetics, Volume 18, Number 2, 30 Jun 2013, Pages 86-89
Abstract
This paper shows a new effective approach to measure crystallization temperature of soft magnetic underlayer (SUL) for next generation of heat assisted perpendicular recording media. This approach uses temperature dependent reflectivity, which shows a clear jump when samples are crystallized. To achieve this measurement, an optical system is set up using hot plate and infrared laser. Reflectivity of SUL (Co70Fe30)92Ta3Zr5 shows a clear jump at its amorphous-crystalline transition temperature. Experiment results show this effect is clear in infrared region, and is weak for visible light.
Keywords: Amorphous thin film; Soft magnetic thin film; Optical property; Perpendicular recording media
DOI: http://dx.doi.org/10.4283/JMAG.2013.18.2.086
Full Text : PDF
![](/views/old_jom/img/center_down.gif)