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Composition Dependence of Perpendicular Magnetic Anisotropy in Ta/CoxFe80-xB20/MgO/Ta (x=0, 10, 60) Multilayers

Journal of Magnetics, Volume 18, Number 1, 31 Mar 2013, Pages 5-8
D. D. Lam (Graduate School of Engineering Science, Osaka University), F. Bonell (Graduate School of Engineering Science, Osaka University), S. Miwa (Graduate School of Engineering Science, Osaka University), Y. Shiota (Graduate School of Engineering Science, Osaka University), K. Yakushiji (National Institute of Advanced Industrial Science and Technology (AIST), Spintronics Research Center), H. Kubota (National Institute of Advanced Industrial Science and Technology (AIST), Spintronics Research Center), T. Nozaki (National Institute of Advanced Industrial Science and Technology (AIST), Spintronics Research Center), A. Fukushima (National Institute of Advanced Industrial Science and Technology (AIST), Spintronics Research Center), S. Yuasa (National Institute of Advanced Industrial Science and Technology (AIST), Spintronics Research Center), Y. Suzuki * (Graduate School of Engineering Science, Osaka University)
Abstract

The perpendicular magnetic anisotropy of sputtered CoFeB thin films covered by MgO was investigated by
vibrating sample magnetometry. Three different CoxFe80-xB20 alloys were studied. Under out-of plane magnetic field, the saturation field was found to increase with increasing the Co content. The magnetization and interface anisotropy energy were obtained for all samples. Both showed a marked dependence on the MgO overlayer thickness. In addition, their variations were found to be non-monotonous as a function of the Co concentration.

 

Keywords: perpendicular magnetic anisotropy; CoFeB/MgO; interface anisotropy; CoFe alloy
DOI: http://dx.doi.org/10.4283/JMAG.2013.18.1.005
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