We have fabricated (0001) oriented hexagonal HoMnO₃ thin films with thickness of 300 nm using Pulsed Laser Deposition (PLD) technique on Pt(111)/Ti/Sio₂/Si substrates. The XRD θ-2θ pattern shows only (0002), (0004), and (0008) reflection of a hexagonal phase, and the full width at half maximum (FWHM) of (0004) peak is under 1.6°. The chemical state of Mn from XPS spectra of the films reveals the presence of Mn³⁺ only. The temperature dependence of dielectric constant shows a weak anomaly at magnetic N'eel temperature(T_N) , which is about 70 K.