Issues

Search

Home > Issues > Search

Magnetic Properties of Sn1-xFexO2 Thin Films and Powders Grown by Chemical Solution Method

Journal of Magnetics, Volume 14, Number 4, 31 Dec 2009, Pages 161-164
Yong Hui Li (Department of Physics, Kookmin University), In-Bo Shim (Department of Physics, Kookmin University), Chul Sung Kim * (Department of Physics, Kookmin University)
Abstract
Iron-doped Sn1-xFexO2(x = 0.0, 0.05, 0.1, 0.2, 0.33) thin films on Si(100) substrates and powders were prepared by a chemical solution process. The x-ray diffraction (XRD) patterns of the Sn1-xFexO2 thin films and powders showed a polycrystalline rutile tetragonal structure. Thermo gravimetric (TG) - differential thermal analysis (DTA) showed the final weight loss above 430 oC for all powder samples. According to XRD Rietveld refinement of the powders, the lattice parameters and unit cell volume decreased with increasing Fe content. The magnetic properties were characterized using a vibrating sample magnetometer (VSM) and Mössbauer spectroscopy. The thin film samples with x = 0.1 and 0.2 showed paramagnetic properties but thin films with x = 0.33 exhibited ferromagnetic properties at room temperature. Mössbauer studies revealed the Fe3+ valence state in the samples. The ferromagnetism in the samples can be interpreted in terms of the direct ferromagnetic coupling of ferric ions via an electron trapped in a bridging oxygen deficiency, which can be explained using the Fcenter exchange model.
Keywords: chemical solution method; Sn1-xFexO2; Mössbauer spectroscopy
DOI: 10.4283/JMAG.2009.14.4.161
Full Text : PDF