Iron-silicon thin films used as a single layer or in sandwich structures are currently regarded as a promising
candidate in high magnetic sensors. A detailed understanding of magnetization dynamics in such thin films is of
great interest. In this work, we only focused on modeling the magnetization reversal. Numerical solution to the
nonlinear Landau-Lifshitz-Gilbert (LLG) equation can be used to conduct the study. With the help of our
developed Matlab code, the simulations were carried out. External field strength, damping parameter and temperature
all have an impact on the speed of the magnetization reversal. The validation of our computations is
achieved via a separate simulation. It relates to the solution of the standard problem proposed by the micromagnetic
Modeling Activity G roup (μMAG ). T he r esults are in agreement with the ones presented in the
National Institute of Standards and Technology (NIST) website.