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Home > Issues > Volume 2 (1997) > No.4(pp.111-156)
The Effects of Deposition Rates on Exchange Coupling and Magnetoresistance in NiO Spin-Valve Films
Journal of Magnetics, Volume 2, Number 4, 31 Dec 1997, Pages 143-146
Abstract
The effects of deposition rate on exchange coupling field Hex and coercive field Hc in NiO spin-valves are discussed. The Hex and Hc increased with deposition rate of NiO film. The rms roughnesses of the NiO deposited at 6 Å/min (NiO-Low) and 30 Å/min (NiO-High) were almost similar, however, the short-range roughness increased with the deposition rate. The Hex, Hc and surface morphologies for the modulated NiO spin-valve films such as NiO-Low\NiO-High\NiO-Low and NiO-High\NiO-Low were investigated.
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