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No.2(pp.41-75)
Home > Issues > Volume 10 (2005) > No.2(pp.41-75)
 
Magnetic Force Microscopy (MFM) Study of Remagnetization Effects in Patterned Ferromagnetic Nanodots
Journal of Magnetics, Volume 10, Number 2, 30 Jun 2005, Pages 58-62
Joonyeon Chang* (Future Technology Research Division, Korea Institute of Science and Technology), A. A. Fraerman(Institute for Physics of microstructures RAS), Suk Hee Han(Future Technology Research Division, Korea Institute of Science and Technology), Hi Jung Kim(Future Technology Research Division, Korea Institute of Science and Technology), S. A. Gusev(Institute for Physics of microstructures RAS), V. L. Mironov(Institute for Physics of microstructures RAS)
Abstract
Periodic magnetic nanodot arrays were successfully produced on glass substrates by interference laser lithography and electron beam lithography methods. Magnetic force microscopy (MFM) observation was carried out on fabricated nanodot arrays. MFM tip induced magnetization effects were clearly observed in ferromagnetic elliptical nanodots varying in material and aspect ratio. Fe-Cr dots with a high aspect ratio show reversible switching of the single domain magnetization state. At the same time, Co nanomagnets with a low aspect ratio exhibit tip induced transitions between the single domain and the vortex state of magnetization. The simple nanolithography is potentially an efficient method for fabrication of patterned magnetic arrays.
Keywords: nanodot; magnetic force microscopy; remagnetization; domain; lithography
DOI:
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