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No.4(pp.97-127)

Home > Issues > Volume 9 (2004) > No.4(pp.97-127)

NiO Thickness Dependences of Perpendicular Magnetic Anisotropy in the [CoFe/Pt] Multilayers

Journal of Magnetics, Volume 9, Number 4, 31 Dec 2004, Pages 121-124

S. W Kim*

(Department of Computer and Electronic Physics, Sangji University), J. Y Lee(Department of Computer and Electronic Physics, Sangji University), S. S Lee(Department of Computer and Electronic Physics, Sangji University), E. J Hahn(Department of Physics, Suwon University), D. G Hwang(Department of Computer and Electronic Physics, Sangji University)

Abstract

NiO thickness dependences of perpendicular magnetic anisotropy (PMA) in the NiO/[CoFe/Ft]₅multilayers for exchange biasing and [CoFe/Ft]₄/Pt/[CoFe/Ft]₄for interlayer exchange coupling were investigated. Perpendicular magnetization curve was obtained by out-of-plane extraordinary Hall measurement. Magnetic force microscopy (MFM) has been used for the investigation of magnetic domains on thin films. We confirmed that the interlayer exchange coupling (IEC) as a function of NiO thickness at room temperature existed with a period of two monolayers.

Keywords: perpendicular magnetic anisotropy (PMA); interlayer exchange coupling (IEC); [CoFe/Pt] multilayers; extraordinary Hall-voltage

DOI:

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