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| Interlayer and Interfacial Exchange Coupling of IrMn Based MTJ |
| Journal of Magnetics, Volume 9, Number 2, 30 Jun 2004, Pages 52-59 |
J. Wrona*  (Department of Electronics, University of Science and Technology), T. Stobiecki(Department of Electronics, University of Science and Technolog), M Czapkiewicz(Department of Electronics, University of Science and Technolog), J. Kanak(Department of Electronics, University of Science and Technolog), R. Rak(Department of Electronics, University of Science and Technolog), M. Tsunoda(Tohoku University, Department of Electronic Engineering), M. Takahashi(Tohoku University, Department of Electronic Engineering) |
| Abstract |
| As deposited and annealed MTJs with the structure of Ta(5nm)/Cu(10nm)/Ta(5nm)/Ni80Fe20(2nm)/Cu(5nm)/Ir25Mn75(10nm)/Co70Fe30(2.5nm)/Al-O/Co70Fe30(2.5nm)/Ni80Fe20(t)/Ta(5nm), where t=10, 30, 60 and 100 nm were characterized by XRD and magnetic hysteresis loops measurements. The XRD measurements were done in grazing incidence (GID scan-2θ) and θ-2θ geometry, by rocking curve (scan-ω) and pole figures in order to establish correlation between texture and crystallites size and magnetic parameters of exchange biased and interlayer coupling. The variations of shifting and coercivity field of free and pinned layers after annealing in 300℃ correlate with the improvement of ［111］ texture and grains size of Ni80Fe20 and Ir25Mn75 respectively. The exchange biased and the coercivity fields of the pinned layer linearly increased with increasing grain size of r25Mn75, The reciprocal proportionality between interlayer coupling and coercivity fields of the free layer and grain size of Ni80Fe20 was found. The enhancement of interlayer coupling between pinned and free layers, after annealing treatment, indicates on the correlated in-phase roughness of dipolar interacting interfaces due to increase of crystallites size of Ni80Fe20. |
| Keywords: interlayer and interfacial exchange coupling; XRD; MOKE and R-VSM magnetometers |
| DOI: |
| Full Text: PDF |
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