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| Temperature Dependence of Exchange Coupling on Magnetic funnel Junctions |
| Journal of Magnetics, Volume 8, Number 1, 31 Mar 2003, Pages 32-35 |
Yongkang Hu(Department of Materials Engineering, Chungnam National University), Cheol-Gi Kim*  (Department of Materials Engineering, Chungnam National University), Stobiecki Tomasz(Department of Electronics, University of Mining and Metallurgy)), Chong-Oh Kim(Department of Materials Engineering, Chungnam National University), in-Hong Kim(Department of Physics, Chungnam National University) |
| Abstract |
| Magnetic funnel Junctions (MTJs) were fabricated on thermally oxidized Si (100) wafers using DC magnetron sputtering. The film Structures were Ta(50Å)/CU(100Å)Ni80/Fe20/(20Å)/Cu(50Å)/Mn75Ir25(100Å)/Co70Fe30/(25Å)/Al-O(15Å)/Co70Fe30(25Å)/Ni80Fe20(t)/Ta(50Å), with t= 0Å , 100 and 1000Å, respectively. X-ray diffraction has shown improvement of (111) texture of IrMn3 and Cu by annealing. The exchange-biased energy is almost inversely proportional to temperature. The difference between the coercivity Hc and the exchange biased field HE for t = 0 sample is smaller than that for t = 1000Å. For the pinned layer, the decreasing rate of the coercivity with the temperature is higher compared to that of the exchange field, but variation of Hc is similar to that of the exchange field for free layer. |
| Keywords: TMR; XRD; exchange coupling |
| DOI: |
| Full Text: PDF |
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