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| Cross Type Domain in Exchange-Coupled NiO/NiFe Bilayers |
| Journal of Magnetics, Volume 7, Number 1, 31 Mar 2002, Pages 9-13 |
D.G. Hwang*  (Department of Computer and Electronic Physics, Sangji University), J.K. Kim(Dept. of Physics, Dankook University), S.S. Lee(Department of Computer and Electronic Physics, Sangji University), R.D. Gomez(Department of Electrical and Computer Engineering, University of Maryland, College Park) |
| Abstract |
| The dependences of microscopic magnetic domain on film thickness in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers were investigated by magnetic force microscopy to better understand for exchange biasing. As NiO thickness increases, microscopic domain structure of unidirectional biased film changed to smaller and more complicated domains. However, for isotropic-coupled film a new cross type domain appeared with out-of plane magnetization orientation. The density of the cross domain is proportional to exchange biasing fields and the fact that the domain was originated by the strongest exchange coupling region was confirmed from the dynamic domain configuration during a magnetization cycle. |
| Keywords: Cross Type Domain; Exchange-Coupled |
| DOI: |
| Full Text: PDF |
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