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No.1(pp.1-25)

Home > Issues > Volume 5 (2000) > No.1(pp.1-25)

Effect of ECR-Ion Milling on Exchange Biasing in NiO/NiFe Bilayers

Journal of Magnetics, Volume 5, Number 1, 31 Mar 2000, Pages 23-25

D. G. Hwang(Department of Physics, Sangji University), S. S. Lee(Department of Physics, Sangji University), K. H. Lee(Department of Physics, Sangji University), K. B. Lee(Department of Physics, Sangji University), D. H. Park(Department of Physics, Sangji University), H. S. Lee(Department of Physics, Sangji University)

Abstract

We have investigated the effects of Ar and O₂-ion milling on the exchange coupling field (H_ex) and coercive field (H_c) at the interfaces between substrates and NiO/NiFe films, to understand the exchange biasing mechanism. The O₂-ion milling was successfully performed by means of the electron cyclotron resonance (ECR) process. We found that the local roughness gradient of the NiO surface increased by O₂-ion milling. The ratio of H_ex/H_c increased from 0.87 to 1.77, whereas H_c decreased by almost a half as a results of the ion milling. The decrease in H_c could be interpreted as due to the refinement of magnetic domain size, which arose from the increase of the local roughness gradient of the NiO surface. The decrease in low H_c and increase in H_ex in NiO spin valves by ECR-ion milling are in the right direction far use in magnetoresistance (MR) heads.

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