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| Study on the Surface Magnetic Domain Structure of Thin-Gauged 3% Si-Fe Strips using Scanning Electron Microscopy with Polarization Analysis |
| Journal of Magnetics, Volume 3, Number 2, 30 Jun 1998, Pages 44-48 |
| K.H. Chai(Division of Metals, Korea Institute of Science and Technology), N. H. Heo(Materials and Corrosion Laboratory, Korea Electric Power Research Institute), J. G. Na(Division of Metals, Korea Institute of Science and Technology), S. R. Lee(Department of Metallurginal Engineering Korea University), J. S. Woo(POSCO Technical Research Laboratories) |
| Abstract |
| Scanning Electron Microscopy with Polarization Analysis (SEMPA) was used to image the surface magnetic domain structure of the 100 µm thick 3% Si-Fe sheet. The thin-gauged 3% Si-Fe strips with magnetic induction (B10) from 1.98 to 1.57 Tesla were prepared via conventional metallurgical processes including melting, hot-and cold-rolling, intermediate annealing and final annealing. Using SEMPA, it was observed that the B10 (1.98 T) Tesla sample was almost composed of 180 stripe domains which are parallel to rolling direction. On the other hand the 3% Si-Fe sheet with B10 (1.57 T) Tesla was composed of large 180˚ stripe domains that are slanted about 30˚ to the rolling direction and complex magnetic domain structures like tree and zigzag pattern. The 180stripe domains, which covered a major part of the sample, had (110)<001> Goss texture parallel to the rolling direction. The domain walls between 180˚ stripe domains were the conventional Bloch type walls. On the other hand, the 90˚ domains, which covered minor part on edge of the sample, were observed in (200) grains. The domain walls between 90˚ domains were the Neel type walls. In high magnification, the elliptical singularity at the Neel walls was clearly observed. |
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