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Volume 21(2016)
· No.1(pp.1-158) XML
· No.2(pp.159-302) XML
· No.3(pp.303-475) XML
· No.4(pp.476-665) XML
Volume 20(2015)
· No.1(pp.1-96) XML
· No.2(pp.92-200) XML
· No.3(pp.201-329) XML
· No.4(pp.331-465) XML
Volume 19(2014)
· No.1(pp.1-100) XML
· No.2(pp101-204) XML
· No.3(pp.205-313) XML
· No.4(pp.315-417) XML
Volume 18(2013)
· No. 1(pp1-79) XML
· No. 2(pp81-219) XML
· No. 3(pp221-374) XML
· No. 4(pp375-493) XML
Volume 17(2012)
· No.1(pp1-71) XML
· No.2(pp73-162) XML
· No.3(pp163-232) XML
· No.4(pp233-308) XML
Volume 16 (2011)
· No.1(pp1-82) XML
· No.2(pp83-195) XML
· No.3(pp197-321) XML
· No.4(pp323-465) XML
Volume 15 (2010)
· No.1(pp1-44) XML
· No.2(pp45-98) XML
· No.3(pp99-147) XML
· No.4(pp149-224) XML
Volume 14 (2009)
· No.1(pp.1-51)
· No.2(pp.53-100)
· No.3(pp.101-136)
· No.4(pp137-180) XML
Volume 13 (2008)
· No.1(pp.1-34)
· No.2(pp.37-80)
· No.3(pp.81-113)
· No.4(pp.115-181)
Volume 12 (2007)
· No.1(pp.1-52)
· No.2(pp.53-92)
· No.3(pp.93-132)
· No.4(pp.133-161)
Volume 11 (2006)
· No.1(pp.1-59)
· No.2(pp.61-102)
· No.3(pp.119-150)
· No.4(pp.151-207)
Volume 10 (2005)
· No.1(pp.1-39)
· No.2(pp.41-75)
· No.3(pp.77-132)
· No.4(pp.133-170)
Volume 9 (2004)
· No.1(pp.1-26)
· No.2(pp.27-68)
· No.3(pp.69-95)
· No.4(pp.97-127)
Volume 8 (2003)
· No.1(pp.1-78)
· No.2(pp.79-102)
· No.3(pp.103-127)
· No.4(pp.129-168)
Volume 7 (2002)
· No.1(pp.1-23)
· No.2(pp.25-59)
· No.3(pp.63-125)
· No.4(pp.127-164)
Volume 6 (2001)
· No.1(pp.1-41)
· No.2(pp.43-76)
· No.3(pp.77-107)
· No.4(pp.109-145)
Volume 5 (2000)
· No.1(pp.1-25)
· No.2(pp.27-71)
· No.3(pp.73-109)
· No.4(pp.111-143)
Volume 4 (1999)
· No.1(pp.1-37)
· No.2(pp.39-69)
· No.3(pp.73-106)
· No.4(pp.107-135)
Volume 3 (1998)
· No.1(pp.1-38)
· No.2(pp.35-66)
· No.3(pp.67-109)
· No.4(pp.111-156)
Volume 2 (1997)
· No.1(pp.1-33)
· No.2(pp.35-66)
· No.3(pp.67-109)
· No.4(pp.111-156)
Volume 1 (1996)
· No.1(pp.1-54)
· No.2(pp.55-100)
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  Volume     Number     Page  
841. Sensitivity of an Anisotropic Magnetoresistance Device with Different Bias Conditions
Journal of Magnetics, Volume 6, Number 1, 31 Mar 2001, Pages 36-41
T. S. Kim, K. C. Kim, Kibo Kim, K. Koh, Y. J. Song*, Y. S. Kim, S. J. Suh, Y. S. Kim
Full Text : PDF
842. Structural and Magnetic Properties of Co-Mn Ferrite Prepared by a Sol-gel Method
Journal of Magnetics, Volume 5, Number 4, 31 Dec 2000, Pages 111-115
Woo Chul Kim, Young Suk Yi, Chul Sung Kim*
Full Text : PDF
843. Unequal Activation Volumes of Wall-motion and Nucleation Process in Co/Pt Multilayers
Journal of Magnetics, Volume 5, Number 4, 31 Dec 2000, Pages 116-119
Yoon-Chul Cho, Sug-Bong Choe, Sung-Chul Shin
Full Text : PDF
844. The Magnetic Properties of Co-Ni-Fe-N Soft Magnetic Thin Films
Journal of Magnetics, Volume 5, Number 4, 31 Dec 2000, Pages 120-123
Y. M. Kim, D. Choi, K. H. Kim, J. Kim, S. H. Han, H. J. Kim
Full Text : PDF
845. Magnetic Hardening of Nano-thick Films Grown by Pulsed Laser Deposition
Journal of Magnetics, Volume 5, Number 4, 31 Dec 2000, Pages 124-129
Choong Jin Yang, Jianmin Wu
Full Text : PDF
846. Application of the Current-applied Pressure-assisted Method for Anisotropic NdFeB Magnets
Journal of Magnetics, Volume 5, Number 4, 31 Dec 2000, Pages 130-134
H. T. Kim, Y. B. Kim, H. S. Kim
Full Text : PDF
847. Angular Modulation of the Giant Magnetoresistance at the Second Antiferromagnetic Maximum in Co/Cu Multilayered System
Journal of Magnetics, Volume 5, Number 4, 31 Dec 2000, Pages 135-138
S. J. Kang, K. Y. Kim, W. T. Ye, J. Lee
Full Text : PDF
848. Interlayer Coupling of CoFe/Cu/NiFe Trilayer Films
Journal of Magnetics, Volume 5, Number 4, 31 Dec 2000, Pages 139-142
Jong-Sung Baek, Woo-Woung Lim, Soo-Hyung Lee, Mee-Yang Kim, Jang-Roh Rhee
Full Text : PDF
849. VMn underlayer for CoCrPt Longitudinal Recording Media
Journal of Magnetics, Volume 5, Number 4, 31 Dec 2000, Pages 143-146
S. C. Oh, T. D. Lee
Full Text : PDF
850. Phase Transitions in KTiOPO4 Studied by 31P Nuclear Magnetic Relaxation
Journal of Magnetics, Volume 5, Number 3, 30 Sep 2000, Pages 73-75
K. S. Kim, C. H. Lee, Cheol-Eui Lee*, N. S. Dalal, R. Fu, S. Y. Jeong, J. N. Kim, S. C. Kim
Full Text : PDF
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