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| Polarization State of Scattered Light in Apertureless Reflection-mode Scanning Near-Field Optical Microscopy |
| Journal of Magnetics, Volume 18, Number 3, 30 Sep 2013, Pages 317-320 |
Yongfu Cai (Department of Materials Science and Technology, Nagaoka University of Technology), Mitsuharu Aoyagi (Department of Materials Science and Technology, Nagaoka University of Technology), Akira Emoto (National Institute of Advanced Industrial Science and Technology (AIST)), Tatsutoshi Shioda (Department of Electrical Engineering, Nagaoka University of Technology), Takayuki Ishibashi *  (Department of Materials Science and Technology, Nagaoka University of Technology) |
| Abstract |
We studied the polarization state in an apertureless scanning near-field microscopy (a-SNOM) operating in reflection mode by using three-dimensional Finite-difference Time-domain (FDTD) method. As a result, the electric field around tip apex in the near-field region enhanced four times stronger than the incident light for ppolarization when the tip-sample separation was 10 nm. We find that the p- and s-polarization state is maintained for the scattered light when the probe is perpendicular to the sample. When the probe is not perpendicular to the sample, the polarization state of scattered light will rotate an angle that equals to the inclination angle of probe with p-polarization illumination. On the other hand, the polarization state will not rotate with s-polarization illumination.
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| Keywords: scanning near-field optical microscopy; FDTD; magneto-optical; near-field optical; polarization state |
| DOI: http://dx.doi.org/10.4283/JMAG.2013.18.3.317 |
| Full Text: PDF |
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